* development-restricted: (578 commits)
Update library version number to 2.13.1
Don't define _POSIX_C_SOURCE in header file
Don't declare and define gmtime()-mutex on Windows platforms
Correct preprocessor guards determining use of gmtime()
Correct documentation of mbedtls_platform_gmtime_r()
Correct typo in documentation of mbedtls_platform_gmtime_r()
Correct POSIX version check to determine presence of gmtime_r()
Improve documentation of mbedtls_platform_gmtime_r()
platform_utils.{c/h} -> platform_util.{c/h}
Don't include platform_time.h if !MBEDTLS_HAVE_TIME
Improve wording of documentation of MBEDTLS_PLATFORM_GMTIME_R_ALT
Fix typo in documentation of MBEDTLS_PLATFORM_GMTIME_R_ALT
Replace 'thread safe' by 'thread-safe' in the documentation
Improve documentation of MBEDTLS_HAVE_TIME_DATE
ChangeLog: Add missing renamings gmtime -> gmtime_r
Improve documentation of MBEDTLS_HAVE_TIME_DATE
Minor documentation improvements
Style: Add missing period in documentation in threading.h
Rename mbedtls_platform_gmtime() to mbedtls_platform_gmtime_r()
Guard decl and use of gmtime mutex by HAVE_TIME_DATE and !GMTIME_ALT
...
previously a single function was used for most test cases (ctr_drbg_validate) making it harder to understand what the exact scenario is as a result it was split into easier to understand functions.
the testing functions were re-factored so that the common code was extracted to a single static function (removing the need for unclear goto statements).
As part of the re-factor the test functions now use data_t for parameters (support for this was introduced in previous rebase),
the change is designed to make configuring 128bit keys for ctr_drbg more similar to other configuration options. Tests have been updated accordingly.
also clarified test naming.
Unify the three existing validation functions (with prediction
resistance, with manual reseeding between generations, and with no
reseeding) into a single function that supports these three scenarios
plus a fourth one (reseed before the first generation).
The four supported scenarios cover the three scenarios from the
current CAVP test vectors (no reseed, reseed before generating,
prediction resistance) plus a fourth scenario used by the existing
test vectors (reseed after generating).
(cherry picked from commit cee9bedee6bc1a8e2b22fa8a31647b62ebb8a0a4)
The ctr_drbg_validate_xxx test functions had hard-coded sizes for the
entropy and the output size. Generalize the sizes.
Keep track of the current entropy size.
Unhexify the expected output and compare with the actual output,
rather than hexifying the actual output and comparing the hex.
Function test_snprintf() is called by run_test_snprintf() with constant test
data. It gets inlined and is subjected to snprintf format truncation checks
introduced by -Wformat-truncation in gcc-7. -Wformat-truncation is turned
On by -Wall and other similar options. It results in error with -Werror.
-Wformat-truncation makes tests performed by run_test_snprintf() redundant
on gcc. But they are still relevant for other compilers. This commit prevents
inlining of test_snprintf() to avoid gcc compile time checks.
Test suite header code was not gaurded with test suite dependency.
But some test suites have additional code in the headers section.
Variables in that section become unused if suite functions are
gaurded. Hence gaurded the headers section.
But this changed cuased missing types in get_expression() function
that was originally accessing types defined through suite headers.
Hence had to gaurd expressions code as well.
Gaurding expressions does not allow parsing the parameters when
some types or hash defs are gaurded. Hence added function
check_test() to check if test is allowed or not before parsing the
parameters.
- Separate string and hex parameter as unhexify is moved out of the function. It's input should only be hex.
- Fix test mbedtls_ccm_encrypt_and_tag that grows input message buffer with tag
- Add missing expected length parameter in ECP TLS tests
- Add deleted TEST_ASSERT and mbedtls calls that got removed in script based code generation
