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add test for lpc176x dd structure

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This commit is contained in:
hathach 2013-06-05 11:45:43 +07:00
parent 0687d6b80d
commit 8123eed39d
1 changed files with 29 additions and 1 deletions
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30
tests/lpc175x_6x/test/test_dcd_lpc175x_6x.c
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@ -54,7 +54,35 @@ void tearDown(void)
{
}
void test_dd_structure(void)
void test_dd_udca_align(void)
{
TEST_ASSERT_BITS_LOW(128-1, (uint32_t) dcd_udca);
}
void test_dd_structure(void)
{
//------------- word 0 -------------//
TEST_ASSERT_EQUAL( 0, offsetof(dcd_dma_descriptor_t, next));
//------------- word 1 -------------//
TEST_ASSERT_EQUAL( 0, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 1, mode) );
TEST_ASSERT_EQUAL( 2, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 1, is_next_valid) );
TEST_ASSERT_EQUAL( 4, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 1, is_isochronous) );
TEST_ASSERT_EQUAL( 5, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 1, max_packet_size) );
TEST_ASSERT_EQUAL( 16, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 1, buffer_length) );
//------------- word 2 -------------//
TEST_ASSERT_EQUAL( 8, offsetof(dcd_dma_descriptor_t, buffer_start_addr) );
//------------- word 3 -------------//
TEST_ASSERT_EQUAL( 0, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, is_retired) );
TEST_ASSERT_EQUAL( 1, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, status) );
TEST_ASSERT_EQUAL( 5, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, iso_last_packet_valid) );
TEST_ASSERT_EQUAL( 6, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, atle_is_lsb_extracted) );
TEST_ASSERT_EQUAL( 7, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, atle_is_msb_extracted) );
TEST_ASSERT_EQUAL( 8, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, atle_message_length_position) );
TEST_ASSERT_EQUAL( 16, BITFIELD_OFFSET_OF_UINT32(dcd_dma_descriptor_t, 3, present_count) );
//------------- word 4 -------------//
}