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Fix spurious test case failure with accelerated AES

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When the PSA RNG uses AES through a PSA driver, it consumes one volatile key
identifier. When MBEDTLS_PSA_KEY_SLOT_DYNAMIC is enabled, that identifier
happens to coincide with the key ID value that the test case assumes not to
exist. Use a different value that avoids this coincidence.

Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
This commit is contained in:
Gilles Peskine 2024-06-13 20:28:58 +02:00
parent 8a13d8297b
commit f39b2e0190
1 changed files with 12 additions and 1 deletions
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13
tests/suites/test_suite_psa_crypto_slot_management.data
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@ -122,7 +122,18 @@ open_fail:PSA_KEY_ID_VENDOR_MAX + 1:PSA_ERROR_DOES_NOT_EXIST
Open failure: invalid identifier (implementation range)
depends_on:MBEDTLS_PSA_CRYPTO_STORAGE_C
open_fail:PSA_KEY_ID_USER_MAX + 1:PSA_ERROR_DOES_NOT_EXIST
# We need to avoid existing volatile key IDs. Normally there aren't any
# existing volatile keys because the test case doesn't create any, but
# in some configurations, the implementation or a driver creates a
# volatile key during initialization for its own use. At the time of
# writing, this happens in builds where AES uses a PSA driver and the
# PSA RNG uses AES-CTR_DRBG through the PSA AES.
# Pick a key id that's in the middle of the volatile key ID range.
# That works out both when MBEDTLS_PSA_KEY_SLOT_DYNAMIC is enabled and
# volatile key IDs are assigned starting with the lowest value, and when
# MBEDTLS_PSA_KEY_SLOT_DYNAMIC is disabled and volatile key IDs are assigned
# starting with the highest values.
open_fail:(PSA_KEY_ID_VOLATILE_MIN + PSA_KEY_ID_VOLATILE_MAX) / 2:PSA_ERROR_DOES_NOT_EXIST
Open failure: non-existent identifier
depends_on:MBEDTLS_PSA_CRYPTO_STORAGE_C