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Dynamic key store: disable full-key-store tests
It's impractical to fill the key store when it can grow to accommodate millions of keys. A later commit will restore those tests in test configurations with the dynamic key store. Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
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@ -101,7 +101,11 @@ exit:
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/* Currently, there is always a maximum number of volatile keys that can
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* realistically be reached in tests. When we add configurations where this
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* is not true, undefine the macro in such configurations. */
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#if defined(MBEDTLS_PSA_KEY_STORE_DYNAMIC)
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#undef MAX_VOLATILE_KEYS
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#else /* Static key store */
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#define MAX_VOLATILE_KEYS MBEDTLS_PSA_KEY_SLOT_COUNT
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#endif
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/* END_HEADER */
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@ -1028,7 +1032,7 @@ exit:
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}
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/* END_CASE */
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/* BEGIN_CASE depends_on:MBEDTLS_PSA_CRYPTO_STORAGE_C */
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/* BEGIN_CASE depends_on:MBEDTLS_PSA_CRYPTO_STORAGE_C:!MBEDTLS_PSA_KEY_STORE_DYNAMIC */
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void non_reusable_key_slots_integrity_in_case_of_key_slot_starvation()
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{
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psa_status_t status;
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@ -1068,7 +1072,14 @@ void non_reusable_key_slots_integrity_in_case_of_key_slot_starvation()
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TEST_ASSERT(mbedtls_svc_key_id_equal(returned_key_id, persistent_key));
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/*
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* Create the maximum available number of volatile keys
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* Create the maximum available number of keys that are locked in
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* memory. This can be:
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* - volatile keys, when MBEDTLS_PSA_KEY_STORE_DYNAMIC is disabled;
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* - opened persistent keys (could work, but not currently implemented
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* in this test function);
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* - keys in use by another thread (we don't do this because it would
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* be hard to arrange and we can't control how long the keys are
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* locked anyway).
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*/
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psa_set_key_lifetime(&attributes, PSA_KEY_LIFETIME_VOLATILE);
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for (i = 0; i < available_key_slots; i++) {
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